Circuit Inspection
WARNING: This page is about a different variant/trim than selected.
| Inspection Condition | (+) Probe | (-) Probe | Specification | ||
|---|---|---|---|---|---|
| Connector | Terminal | Connector | Terminal | ||
|
Cluster connector | 39, 40 (power) | Chassis ground | - | Battery voltage |
|
Cluster connector | 1, 37 (ground) | Chassis ground | - | Approx. below 1Ω |
|
PCM (component side) | 77 (P-CAN high) | Chassis ground | - | Fig.1 |
| PCM (component side) | 60 (P-CAN low) | Chassis ground | - | ||
| Cluster connector | 32 (C-CAN high) | Chassis ground | - | Fig.2 | |
| Cluster connector | 33 (C-CAN low) | Chassis ground | - | ||
|
PCM connector | 77 (P-CAN high) | ICU connector | 12 (P-CAN high) | Approx. below 1Ω |
| PCM connector | 60 (P-CAN low) | ICU connector | 11 (P-CAN low) | ||
|
Cluster connector | 32 (C-CAN high) | ICU connector | 9 (C-CAN high) | Approx. below 1Ω |
| Cluster connector | 33 (C-CAN low) | ICU connector | 10 (C-CAN low) | ||
|
Cluster connector | 32 (C-CAN high) | Cluster connector | 33 (C-CAN low) | Approx. 60Ω |
|
ICU (component side) | 9 (C-CAN high) | ICU (component side) | 10 (C-CAN low) | Approx. 120Ω |
| Cluster (component side) | 32 (C-CAN high) | Cluster (component side) | 33 (C-CAN low) | Approx. 120Ω | |
Good
- Fault is intermittent caused by poor contact in the sensor's and/or PCM's connector or was repaired and PCM memory was not cleared. Thoroughly check connectors for looseness, poor connection, bending, corrosion, contamination, deterioration, or damage. Repair or replace as necessary and go to "Verification of Repair " procedure.
No Good
- Repair or replace as necessary and then go to "Verification of Repair " procedure.