Test Description
6. This step is a preliminary test to try to identify if a malfunction is present in the SPI serial data "A" circuit.
9. This step is a preliminary test to try to identify in which area of the circuit the malfunction could be present.
10. This step is a preliminary test to try to identify if a malfunction is present in the SPI serial data "B" circuit.
12. This step is a preliminary test to try to identify in which area of the SPI serial data Clock circuit the malfunction could be present.
14. This multiple test is for checking the condition of the wiring media of the SPI serial data "A" circuit and the harness connectors used between the two modules.
15. This multiple test is for checking the condition of the wiring media of the SPI serial data "B" circuit and the harness connectors used between the two modules.
16. This multiple test is for checking the condition of the wiring media and the harness connectors used between the two modules in the SPI serial data Clock circuit.
17. This step instructs, to replace the IPC. Because of the necessity of higher order electronic test equipment to fully analyze the SPI serial data circuit, it may also be necessary to also replace the BCM.
18. This step instructs, to replace the BCM. Because of the necessity of higher order electronic test equipment to fully analyze the SPI serial data circuit, it may also be necessary to also replace the IPC.