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Circuit/System Testing

WARNING: This page is about a different variant/trim than selected.
NOTE:

When test probing harness terminals, it is imperative to use the proper test probe from the most current version of the J 35616  GM-Approved Terminal Test Kit. Use of an improper test probe may deform the terminal, resulting in intermittent open conditions.

  1. Key OFF. Disconnect the X1 connector at the transfer case encoder motor (TCEM).
  2. Key ON, engine OFF.
  3. Attach scan tool. If DTC C0396-05 is set, test the following circuits for an open/high resistance or short to voltage condition.
    • Incremental Encoder Impulse Signal
    • Incremental Encoder Direction Signal
  4. Clear codes. DTC C0396-04 may remain in memory.
  5. Using the PU probe J 35616-4A, test for 7.50-8.50 V between the incremental encoder sensor (8 V) supply circuit, TCEM X1 pin G and a good ground.
    • If the voltage is greater than the specified range, test the affected circuit for a short to voltage. If all circuits and connections test normal, test the TCCM for proper operation.
    • If the voltage is less than the specified range, test the affected circuit for a short to ground, an open/high resistance or short to voltage. If all circuits and connections test normal, TCCM for proper operation.
  6. Using the PU probe J 35616-4A, test for 7.50-8.50 V between the incremental encoder sensor (8 V) supply circuit, TCEM X1 pin G and the Low Reference circuit, TCEM X1 pin H.
    • If the voltage is greater than the specified range, test the low reference circuit for a short to voltage. If all circuits and connections test normal, test the TCCM for proper operation.
    • If the voltage is less than the specified range, test the low reference circuit for a short to ground, an open/high resistance or short to voltage. If all circuits and connections test normal, test the TCCM for proper operation.
  7. Using the PU probe J 35616-4A, test for 6.0-7.0 V between the incremental encoder impulse signal circuit, TCEM X1 pin E and a good ground.
    • If the voltage is greater than the specified range, test the affected circuit for a short to voltage. If all circuits and connections test normal, test the TCCM for proper operation.
    • If the voltage is less than the specified range, test the affected circuit for a short to ground, an open/high resistance or short to voltage. If all circuits and connections test normal, test the TCCM for proper operation.
  8. Using the PU probe J 35616-4A, test for 6.0-7.0 V between the incremental encoder direction signal circuit, TCEM X1 pin F and a good ground.
    • If the voltage is greater than the specified range, test the affected circuit for a short to voltage. If all circuits and connections test normal, test the TCCM for proper operation.
    • If the voltage is less than the specified range, test the affected circuit for a short to ground, an open/high resistance or short to voltage. If all circuits and connections test normal, test the TCCM for proper operation.
  9. Using the PU probe J 35616-4A, test for greater than 500 Ω between the incremental encoder sensor (8 V) supply circuit, TCEM X1 pin G and all other pins of the TCEM X1.
    • If the resistance is less than the specified range, test the affected circuits for a shorted together condition. If all circuits and connections test normal, test the TCCM for proper operation.
  10. Using the PU probe J 35616-4A, test for greater than 500 Ω between the incremental encoder impulse signal circuit, TCEM X1 pin E and all other pins of the TCEM X1.
    • If the resistance is less than the specified range, test the affected circuits for a shorted together condition. If all circuits and connections test normal, test the TCCM for proper operation.
  11. Using the PU probe J 35616-4A, test for greater than 10 Ω between the incremental encoder direction signal circuit, TCEM X1 pin F and all other pins of the TCEM X1.
    • If the resistance is less than the specified range, test the affected circuits for a shorted together condition. If all circuits and connections test normal, test the TCCM for proper operation.
  12. Using the PU probe J 35616-4A, test for greater than 10 Ω between the low reference circuit, TCEM X1 pin H and all other pins of the TCEM X1.
    • If the resistance is less than the specified range, test the affected circuits for a shorted together condition. If all circuits and connections test normal, test the TCCM for proper operation.
  13. Test the TCEM for proper operation.
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